Description
Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on Transmission Electron Microscopy and Diffractometry of Materials.
James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.
Zusammenfassung
New edition of successful, well-reviewed textbook
Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry
Shows how wave radiation probes the structure of materials
Supports learning and teaching with numerous problems at the end of each chapter to give students practice with the concepts and practical applications
Explains the mathematics needed consistently through the book
Helps to extend knowledge by indicating further reading
Explains concepts in detail, with no requirement for different reference materials
Includes supplementary material: […]
Erscheinungsjahr: | 2012 |
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Fachbereich: | Fertigungstechnik |
Genre: | Mathematik, Medizin, Naturwissenschaften, Technik |
Rubrik: | Naturwissenschaften & Technik |
Medium: | Buch |
Inhalt: | xx 764 S. |
ISBN-13: | 9783642297601 |
ISBN-10: | 3642297609 |
Sprache: | Englisch |
Herstellernummer: | 86078209 |
Einband: | Gebunden |
Autor: | Howe, James Fultz, Brent |
Auflage: | Fourth Edition 2013 |
Hersteller: | Springer-Verlag GmbH Springer Berlin Heidelberg |
Verantwortliche Person für die EU: | |
Maße: | 241 x 160 x 47 mm |
Von/Mit: | James Howe (u. a.) |
Erscheinungsdatum: | 14.10.2012 |
Gewicht: | 1,326 kg |
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